SnapScan 3D
Scan documents, capture data, analyze results
Schlumberger Technology Corporation
iPhone Screenshots
Description
Analyzes PDC cutter damage using machine learning to generate accurate IADC dull grades. Users capture and organize bit images, track agility metrics, and perform data capture. Forensics analysis is conducted within the interface.
Postrun bit dull grading made quick and easy. SnapScan is the most utilized, accurate and reliable cutter damage analysis system in the market. It supports 3 main aspects: agility, data capture, and forensics analysis. It is elegant in a phone interface, and it is very simple to use. Simple, easy, but powerful: let the machine learning algorithm analyze each PDC cutter and support the correct IADC dull grading generation while organizing your bit pictures.