Calibrate atomic force microscope cantilevers using the . Input resonant frequency and quality factor measurements. Calculate spring constant and display results. Export data for analysis.
by John Sader★ 5.01 ratingsUtilitiesFreeData updated 2026-09-08
Calculate microstrip line width and effective dielectric constant using substrate data and impedance values. Design Substrate Integrated Waveguide (SIW) structures. Create transitions between microstrip lines and SIW.
The app generates random 5-letter words for Morse Code practice. It sends these words using the iPhone speaker and allows users to set WPM, dot speed, and tone frequency.
Convert units with custom and combined measurements
Convert units of measurement with a calculator that handles multiple conversions at once. Input expressions for complex calculations. Support custom units and combined conversions.